And to its powerful sem line, jeol has now added the highperformance multipurpose jsm35. Jsm7610f is an ultra high resolution schottky field emission scanning electron microscope which has semiinlens objective lens. For the love of physics walter lewin may 16, 2011 duration. Jeol fe sem with gatan 3view serial block face imaging of synapse. Check with your it staff well ahead of time, as sometimes special permission is required to load programs on school equipment. Equipped with our sophisticated analytical series, the jsmit500 facilitates any analyses from specimen loading to report generation. This new microscope is exposing structures that couldnt be seen before. Jeol 7000 fe scanning electron microscope ua analytical. Ease of use is a key feature of our successful intouchscope series while maintaining the versatility and expandability expected from a researchgrade sem. It provides optimal tools for studying the widest possible variety of sample materials. Microscope jeol jem2100 hr standard operating procedure 16 pages. Rotate the power key switch to the start position, and release the hand from the key. The sounds in the video form part of microscope music and are derived from recordings made from components of the original instrument, as well as sonified text and image files relating to its operation. Microscope jeol jsm6060lv operating instructions manual 12 pages.
Jsm7200f schottky field emission scanning electron. Field emission scanning electron microscope jsm 7800f extreme resolution the super hybrid lens shl provides extreme resolution of 0. Equipped with our sophisticated analytical series, the jsmit500 facilitates any analyses from. Introducing a true integration of optical and sem imaging with video. E camino, 092514 12 lower the specimenexchange rod horizontally without pulling along its axis see fig. Jsm7800fprime delivers the worlds best resolution with the incorporation of the newlydeveloped, superhigh resolution gentle beam gbsh. A conical fe gun and semiinlens objective generate high resolution images.
Jsm7800f schottky field emission scanning electron. Jeol jsm6480 sem instruction manual 4 prepared by haitao zhang, revised may 2011 decrease the aperture 3 2 1, pull the knob outward and then rotate it counterclockwise to stop and then release it. Jsm7800fprime schottky field emission scanning electron. Jsm7600f schottky field emission scanning electron. With time, we will add sections as operating procedures are developed or improved by user experience.
Jeol jsmt200 manuals manuals and user guides for jeol jsmt200. The jsm7001f analytical thermal field emission sem is the ideal platform for demanding analytical applications as well as those requiring high resolution and easeofuse. We have 1 jeol jsmt200 manual available for free pdf download. It can also be used to do electron beam lithography. See the features and performance of jeol s jsm6010 scanning electron microscope. Jeol 7600f high resolution analytical sem operating procedure v. Jsm6700 field emission scanning electron microscope. Field emission scanning electron microscope jsm7800f extreme resolution the super hybrid lens shl provides extreme resolution of 0. A spotlight on researchers work using jeol electron microscopy or jeol analytical instruments, and how their scientific advances are impacting their field. With a very low incident electron energy, extremely fine surface structures are revealed. A version of this video formed part of an installation in the microscope project, a major artscience collaboration i did in 2014. Pumps running and evac light green main panel near key switch.
Its also suitable for high spatial resolution analysis. Landing voltage of 10v approaching scanning auger sensitivity for surface analysis. Documents of interest in support of your jeol product a guide to scanning microscope observation we included in this book as many application examples as possible so that they can be used as criteria for judging what causes unsatisfactory image factors hereinafter referred to as image disturbances. Jeol jsm7600f fieldemission sem the 7600f is a fieldemission scanning electron microscope that magnifies up to one million times for visualization and imaging of nanoscalesized objects. Jeol is a world leader in electron optical equipment and instrumentation for highend scientific and industrial research and development. Basic operation ppt exploring the jeol program ppt intro to oxford edx ppt oxford channel 5 user manual pdf related links. Highresolution lowvoltage scanning electron microscope. Jeol usa jsmit500hr high resolution, large chamber. Turn on the scanning image observation instrument with the ope power switch at the rear of the instrument. Jeol provides valuable applications support, comprehensive training, and awardwinning service for the long lifetime of our instruments. Nanoscale fabrication and characterization facility, petersen institute of naoscience and engineering, university of pittsburgh, 348 benedum ha ll, 3700 ohara street, pittsburgh, pa 15261. A constant leader in the field of electron optics instrumentation, jeol has already supplied more than scanning microscopes the world over. Jsm 5410lv the following illustrations and descriptions refer to the instrument model and are drawn from brochures.
Extreme high resolution field emission sem jsm7800f prime. The jsm7001f has a large, 5axis, fully eccentric, motorized, automated specimen stage, a oneaction specimen exchange airlock. High power optics can provide high throughput and high performance analysis. The jsm6700f is a high resolution, easytooperate scaning electron microscope, based on a new cold filed emission gun electron source and employing stateoftheart computer control and imaging. This document is an introduction to the operation of the jeol 5800lv scanning electron microscope and the oxford isis 300 analytical system. We have 1 jeol jsm6060lv manual available for free pdf download. Brief manual for jeoljsm6480 sem university of north. Jeol usa jsmit500 variable pressure sem microscope. Basic stepbystep instructions for jeol 6060lv version 411 general operation 1.
The jsmit100, equipped with 50 years of jeol sem technologies, is a compact, versatile scanning electron microscope. Oxford instruments inca tips some useful tips when using the oxford inca system. Release of a new schottky field emission scanning electron microscope, jsm7900f highend nextgeneration analytical tool, highperformance fesem successfully combining ultrahigh resolution and superbly high operability catalogue download. We have 1 jeol jspm5200 manual available for free pdf download. We will provide you with information about downloading free remote control software that will allow you to control the microscope with your computer over the internet. This manual should be considered a work in progress. Operating procedure for jeol 7600f high resolution. Jeol jsm6060lv operating instructions manual 12 pages scanning electron microscope. The newlydeveloped super hybrid lens shl is used to achieve the nextgeneration highresolution sem, without sacrificing operability. The distribution of materials can be observed even below 1 kev by selecting backscattered. Jsm 7800fprime delivers the worlds best resolution with the incorporation of the newlydeveloped, superhigh resolution gentle beam gbsh. Semiinlens provides highresolution observation and analysis high resolution observation and high spatial resolution analysis is achieved through the combination of a semiinlens type objective lens that can collimate the electron beam even at low accelerating voltages, and the inlens schottky electron source that provides a stable current over a long service life.
Jsm7200f has much higher spatial resolution than the conventional models at both high and low accelerating voltages by applying the technology used for inlens schottkyplus, the electron optics equipped on our flagshipmodel, jsm7800fprime, and by incorporating ttls throughthelens system. The jsmit500 intouchscope sem series offers versatile research grade scanning electron microscopes smart flexible powerful. S c a n n i n g introduction he jeol jsm6060lv is a stateoftheart scanning electron microscope that features a low vacuum for observation of nonconductive specimens, a fully automated electron gun, a backscattered electron detector for atomic number contrast imaging, fully integrated digital control, motorized xy stage, and a noran system. Smart the latest innovations for our intouchscope series sems are designed to make sem accessible to everyone. Open the load lock chamber and remove the sample holder load lock should already be vented. Jeol scanning electron microscope jsm5410lv, ulvac pump brand, eyela cooling circulator, oxford eds, jeol semafore software, software for control and evaluation license, sputter coater. Jeol jsmit500 intouchscopetm scanning electron microscope. Our analytical series includes jeol s fullyembedded eds system which provides realtime eds spectra during image observation.
In addition, the maximum probe current of the inlens schottky plus gun has been increased from 200 na to 500 na. The internal polymer network of the hydrogel was investigated by using a field emission sem jeol, jsm 7800 f operated at 2 kv acceleration voltage. Low vacuum capability is built in allowing for imaging and analysis of all types of samples in their native state. The jsmit500hr accommodates a wide variety of sample types. It is especially useful for surface sensitive analysis and analysis of beam sensitive materials as the landing energy of the electrons can be as low as 10 v. Once it is completely horizontal, the low pressure in the chamber may suck the rod in. Page 1 sem jeol, jsm 6301 operation manual 2014 06 11 the turning on the sem 1. Jsm7900f schottky field emission scanning electron microscope. All the controls are at your fingertips with an intuitive software interface. Jeol has played a leading role in the development and evolution of scanning electron microscopes since the early 1960s.
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